Zuverlässigkeitsprognose für Mikroelektronik von Joseph B. Bernstein (Englisch) Har
162,08 €
With nano-scale microelectronic devices increasingly prominent in modern life, it has never been more important to understand the tools available to evaluate reliability. It takes as its core subject the 'physics of failure', combining a thorough understanding of conventional approaches to reliability evaluation with a keen knowledge of their blind spots.
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