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Defects in SiO2 and Related Dielectrics: Science and Technology

Name: Defects in SiO2 and Related Dielectrics: Science and Technology
SKU: 266454138300
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Edited by G. Pacchioni, L. Skuja and D. L. Griscom.

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Reihe:

Mathematics, Physics and Chemistry
Fach:

Ingenieurwissenschaften & Technik
Produktart:

Fachbuch
Format:

Taschenbuch
Besonderheiten:

Ehemaliges Bibliotheksexemplar
Erscheinungsjahr:

2000
Anzahl der Seiten:

624
Autor:

D. L. Griscom, L. Skuja, G. Pacchioni
Verlag:

Kluwer Academic Publishers
Publikationsname:

Defects in SiO2 and Related Dielectrics
Sprache:

Englisch
ISBN:

0792366867

Standardversand:

DHL Päckchen 5,00 EUR - Lieferung zwischen 27. May 2025 und 28. May 2025 (bei heutigem Zahlungseingang)
Versand nach:

Weltweit
Versand ausgeschlossen:

Russische Föderation

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