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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratchin

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Atomic Force Microscopy. - Scanning Near-Field Optical Microscopy. Short Title ATOMIC FORCE MICROSCOPY SCANNI. It outlines the handling of natural and technical samples in relation to those of flat standard samples and emphasizes new special features.

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ISBN-13:

9783540284055
Book Title:

Atomic Force Microscopy, Scanning Nearfield Optical Microscopy an
ISBN:

9783540284055

None:

International Standard : tracked-no signature (7 to 15 business days) 43,22 EUR - Lieferung zwischen 21. May 2025 und 30. May 2025 (bei heutigem Zahlungseingang)
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