Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents by Ad
167,39 €
Forces do play an important role in Scanning Tunneling Microscopy (STM), and currents are an important issue in Atomic Force Microscopy (AFM). This unique overview fills the gap in the litterature. Scanning Probe Microscopy is a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory.
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