Accelerated Life Testing of One-shot Devices: Data Collection and Analysis by Na
146,52 €
Topics covered include likelihood inference, competing-risks models, one-shot devices with dependent components, model selection, and more. Highlights important issues, problems, and future research directions in reliability theory and practice Accelerated Life Testing of One-shot Devices: Data Collection and Analysis is essential reading for graduate students, researchers, and engineers working on accelerated life testing data analysis.
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