Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies An
106,99 €
Titel: Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies, Einband: Buch, Autor: António Manuel Lourenço Canelas, Verlag: Springer International Publishing, Springer International Publishing, Sprache: Englisch, Seiten: 264, Maße: 241x160x20 mm, Gewicht: 565 g, Verkäufer: buch-mimpf, Schlagworte: Analog Design Centering and Sizing Analog IC Reliability in Nanometer CMOS Monte Carlo-Based Yield Estimation Variation-Aware Design of Custom Integrated Circuits analog integrated circuit yield estimation.
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