Yield and Variability Optimization of Integrated Circuits by M.A. Styblinski (En
121,58 €
By M.A. Styblinski, Jian Cheng Zhang. 1 Introduction. - 1.1 Design for Quality and Manufacturability. - 1.2 Notation. - 1.3 Interpretation of Basic Concepts. - 1.4 Summary. - 2 Overview of IC Statistical Modeling.
Jetzt bei Ebay:
