VLSI-SoC: New Technology Enabler: 27th IFIP WG 10.5/IEEE International
91,94 €
Software-Based Self-Test for Delay Faults. - On Test Generation for Microprocessors for Extended Class of Functional Faults. - Robust FinFET Schmitt Trigger Designs for Low Power Applications. - An Improved Technique for Logic Gate Susceptibility Evaluation of Single Event Transient Faults.
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