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Testen von statischen Arbeitsspeichern: Defekte, Fehlermodelle und Testmuster...

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139,53 €

Th begins with outlining the most popular SRAMs architectures. The impact of the port restrictions (., read-only ports) on the fault models, tests, and test strategies is also discussed.

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  • Book Title:
    Testing Static Random Access Memories : Defects, Fault Models, an
  • ISBN:
    9781402077524
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    Standard International Shipping 18,26 EUR - Lieferung zwischen 14. July 2025 und 24. July 2025 (bei heutigem Zahlungseingang)
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