Tests auf Defekte mit geringer Verzögerung in integrierten nanoskaligen CMOS-Schaltungen, Hardco...
219,54 €
Testing for Small-delay Defects in Nanoscale Cmos Integrated Circuits, Hardcover by Chakrabarty, Krishnendu (EDT); Goel, Sandeep Kumar (EDT), ISBN 1439829411, ISBN-13 9781439829417, Like New Used, Free shipping in the US Computer scientists and electrical engineers describe methods for testing nanometer-scale integrated circuits for small defects that would delay the passage of signals. Their topics include timing-aware automatic test pattern generation, a faster-than-at-speed test for screening small-delay defects, testing based on output deviations, circuit-topology-based test pattern generation for small-defect defects, and small-delay defect coverage metrics. Annotation ©2014 Book News, Inc., Portland, OR ()
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