Structural, Syntactic, and Statistical Pattern Recognition Andrea Torsello
Titel: Structural, Syntactic, and Statistical Pattern Recognition, Untertitel: Joint IAPR International Workshops, S+SSPR 2020, Padua, Italy, January 21-22, 2021, Proceedings, Einband: Taschenbuch, Autor: Andrea Torsello, Verlag: Springer International Publishing, Springer Nature Switzerland, Sprache: Englisch, Seiten: 392, Maße: 235x155x22 mm, Gewicht: 593 g, Verkäufer: buch-mimpf, Schlagworte: Algorithm analysis and problem complexity Artificial Intelligence Computer Science Computer Systems Computer vision Directed Graphs Engineering Image Analysis Image segmentation Internet Learning Machine Learning Neural Networks Signal Processing computer networks education graph theory image processing mathematics pattern recognition theoretical computer science.
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