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Zuverlässigkeit weicher Fehler von VLSI-Schaltungen: Analyse- und Minderungstechniken

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Mohsen Raji received his Ph.D. degree in computer engineering from Amirkabir University of Technology, Tehran, Iran. He has been serving as an Assistant Professor in School of Electrical and Computer Engineering, Shiraz University, Shiraz, Iran, since 2015.

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  • EAN:
    9783030516123
  • UPC:
    9783030516123
  • ISBN:
    9783030516123
  • Book Title:
    Soft Error Reliability of VLSI Circuits: Analysis
  • Item Length:
    23.4 cm
  • Item Weight:
    0.19 kg
  • Economy Shipping from outside:
    eBay SpeedPAK Economy 16,57 EUR - Lieferung zwischen 25. June 2025 und 08. July 2025 (bei heutigem Zahlungseingang)
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