Semiconductor Memories: Technology, Testing, and Reliability by Ashok K. Sharma
244,19 €
Chapter 1: Introduction. 2.1 Introduction. 3.1 Introduction. 3.5 Electrically Erasable PROMs (EEPROMs). 4.1 Introduction. . 4.2 RAM Fault Modeling. 4.3 RAM Electrical Testing. 4.7 IDDQ Fault Modeling and Testing.
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