RF and Time-domain Techniques for Evaluating Novel Semiconductor Transistors Kei
64,19 €
Titel: RF and Time-domain Techniques for Evaluating Novel Semiconductor Transistors, Einband: Taschenbuch, Autor: Keith A. Jenkins, Verlag: Springer International Publishing, Springer Nature Switzerland, Sprache: Englisch, Seiten: 180, Maße: 235x155x11 mm, Gewicht: 283 g, Verkäufer: buch-mimpf, Schlagworte: Characterization of novel transistors Expected frequency response of FET and BJT transistors Frequency characterization of novel devices Transient and time-dependent phenomena in novel devices electrical performance of novel devices.
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