Physikalische Grundlagen der Elektronenmikroskopie: eine Einführung - NEU RF. Egerton 2018
87,97 €
Title:-Physical Principles of Electron Microscopy: an Introduction to Tem, Sem, and Aem Author:-R.F. Egerton Format:-Paperback ISBN13:-9783319819860 Language:-English Publisher:-Springer International Publishing A&G Publication Date:-2018 Pages:-196 Pages Category:-History Textbook Condition:-Brand New
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