Mos Grenzflächenphysik, Prozess und Charakterisierung, Taschenbuch von Wang, Sheng...
72,74 €
Mos Interface Physics, Process and Characterization, Paperback by Wang, Shengkai; Wang, Xiaolei, ISBN 103210628X, ISBN-13 9781032106281, Like New Used, Free shipping in the US The electronic device based on Metal Oxide Semiconductor (MOS) structure is the most important component of a large-scale integrated circuit and the key to achieving high performance devices. This book contains experimental examples focusing on MOS and will be a reference for academics and postgraduates in the field of microelectronics.
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