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Modeling of Electrical Overstress in Integrated Circuits by Carlos H. Diaz (Engl

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These reliability concerns are becoming more serious with the downward scaling of device feature sizes. Modeling of Electrical Overstress in Integrated Circuits presents a comprehensive analysis of EOS/ESD-related failures in I/O protection devices in integrated circuits.

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ISBN-13:

9781461362050
Book Title:

Modeling of Electrical Overstress in Integrated Circuits
ISBN:

9781461362050

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