Maschinelles Lernen Unterstützung für Fehlerdiagnose von System-on-Chip, Taschenbuch von...
60,39 €
This book provides a state-of-the-art guide to Machine Learning (ML)-based techniques that have been shown to be highly efficient for diagnosis of failures in electronic circuits and systems. These techniques can be used for failure isolation in logic or analog circuits, board-level fault diagnosis, or even wafer-level failure cluster identification.
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