Hot-Carrier Reliability of MOS VLSI Circuits by Yusuf Leblebici (English) Hardco
215,56 €
By Yusuf Leblebici, Sung-Mo Kang. Yusuf Leblebici is Director and Chair Professor of the Microelectronic Systems Laboratory at the Swiss Federal Institute of Technology in Lausanne (EPFL). Hot-carrier induced degrada.
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