Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microa
157,38 €
He has taught for more than thirty years at the Lehigh University Microscopy School and is the author and co-auther of eight books on scanning electron microscopy and x-ray microanalysis. The formation of the image depends on collecting the different signals that are scattered as a consequence of the high energy beam interacting with the sample.
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