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Evaluation of Advanced Semiconductor Materials by Electron Microscopy by David C

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High Resolution Electron Microscopy. - HREM of Edge-on Interfaces and Defects. - Image Processing Applied to HRTEM Images of Interfaces. - II-VI Semiconductor Interfaces. - High Resolution Electron Microscopy Study of Indium Distribution in InAs/GaAs Multilayers.

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ISBN-13:

9781461278504
Book Title:

Evaluation of Advanced Semiconductor Materials by Electron Micros
ISBN:

9781461278504

None:

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