Elektronenmikroskopie und Analyse, Taschenbuch von Goodhew, P. J.; Humphreys, Joh...
Electron Microscopy and Analysis, Paperback by Goodhew, P. J.; Humphreys, John; Beanland, Richard; Humphreys, F. J., ISBN 0748409688, ISBN-13 9780748409686, Brand New, Free P&P in the UK Three British professors introduce the principles behind both scanning and transmission electron microscopes, describing the techniques of electron energy loss spectroscopy and energy dispersive X-ray analysis. The third edition adds outlines of confocal light microscopy and scanned probe microscopies. Annotation c. Book News, Inc., Portland, OR ()
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