Defect and Fault Tolerance in VLSI Systems: Volume 2 by C.H. Stapper (English) P
165,91 €
By C.H. Stapper, V.K. Jain, Gabriele Saucier. - Yield Models — Comparative Study. - 2 Models for Defects and Yield. - A Unified Approach to Yield Analysis of Defect Tolerant Circuits. - Systematic Extraction of Critical Areas From IC Layouts.
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