Analysis of Residual Stress by Diffraction Using Neutron and Synchrotron Radi...
74,29 €
Analysis of Residual Stress by Diffraction Using Neutron and Synchrotron Radiation, Paperback by Fitzpatrick, M. E. (EDT); Lodini, Alain (EDT), ISBN 0367446804, ISBN-13 9780367446802, Like New Used, Free shipping in the US Neutron and synchrotron X-ray diffraction have emerged as leading techniques for stress analysis. This book presents an overview of the principles of these techniques and examples of their applications to a range of materials and engineering problems. It contains 20 papers from leading international experts in residual stress analysis covering the
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